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Defect Dynamics Research

Exploring mathematical mappings and computational tools for analyzing neural network parameter defects.

Defect Dynamics

Exploring mathematical models of crystal defect dynamics and neural networks.

A hand holding a smartphone in a dimly lit environment, displaying text related to mobile optimization. The focus is on the smartphone screen, and the background is a blurred wooden surface.
A hand holding a smartphone in a dimly lit environment, displaying text related to mobile optimization. The focus is on the smartphone screen, and the background is a blurred wooden surface.
Phase One

Mapping relationships between defects and neural network parameters.

A computer screen displaying a webpage about ChatGPT, focusing on optimizing language models for dialogue. The webpage has text describing the model and includes the OpenAI logo. The background is green with some purple graphical elements on the side.
A computer screen displaying a webpage about ChatGPT, focusing on optimizing language models for dialogue. The webpage has text describing the model and includes the OpenAI logo. The background is green with some purple graphical elements on the side.
A close-up view of a mechanical testing apparatus used for material analysis, featuring metal clamps and screws against a background with windows.
A close-up view of a mechanical testing apparatus used for material analysis, featuring metal clamps and screws against a background with windows.
A computer screen displays a PageSpeed Insights report for the website google.com, showing a high performance score of 99. The report includes metrics such as First Contentful Paint (FCP), Largest Contentful Paint (LCP), First Input Delay (FID), and Cumulative Layout Shift (CLS), all of which are represented with graphical progress bars.
A computer screen displays a PageSpeed Insights report for the website google.com, showing a high performance score of 99. The report includes metrics such as First Contentful Paint (FCP), Largest Contentful Paint (LCP), First Input Delay (FID), and Cumulative Layout Shift (CLS), all of which are represented with graphical progress bars.
Phase Two

Developing computational tools for defect detection and analysis.